Relevant Degree Programs
Graduate Student Supervision
Doctoral Student Supervision (Jan 2008 - Mar 2019)
The aim of this thesis is to investigate three aspects related to phosphorus diffusion for doping profile control in PNP SiGe HBTs:We systematically and quantitatively investigated the impact of carbon and Ge on P diffusion in strained SiGe:C up to 18% Ge and 0.32% C through experiments, which shows that the incorporation of carbon to retard P diffusion is not as effective in SiGe as it is in Si. Models were established to calculate the effective P diffusivities as a function of carbon concentration. These models can also be applied to boron, phosphorus, arsenic and antimony diffusion in Si with the presence of carbon. These results indicate that the microscopic mechanism of P diffusion in Si₀.₈₂Ge₀.₁₈ has a small but non-negligible vacancy-mediated term. An experimental study of thermal nitridation effects on phosphorus diffusion in strained Si1-xGex and strained Si1-xGex:Cy was performed. P diffusivities under thermal nitridation (vacancy injection) and the effective inert condition were compared. The result shows that thermal nitridation can retard P diffusion in SiGe with up to 18% Ge content, but the effectiveness of this retardation decreases with increasing Ge and C content. The Ge dependence can be explained by the increasing contribution from vacancy-assisted mechanism for P diffusion in strained SiGe with the increasing Ge content. P tends to segregate out of SiGe region, which happens simultaneously with diffusion. A coupled diffusion and segregation model is needed to predict the P profile evolution at thin SiGe layers. The model was re-derived theoretically, where the contributions from diffusion and segregation to dopant flux are explicitly shown. The model is generic to coupled diffusion and segregation in inhomogeneous alloys, and provides a new approach in segregation coefficient extraction. This model is especially helpful for heterostructures with lattice mismatch strains. Experiments of coupled P diffusion and segregation were performed with graded SiGe layers for Ge molar fractions up to 0.18, which are relevant to PNP SiGe HBTs. The model was shown to describe both diffusion and segregation behavior well.
SiGe heterostructures with higher Ge fractions and larger Ge modulations, and thus higher compressive stress, are key structures for next-generation electronic and optoelectronic devices. Si-Ge interdiffusion during high temperature growth or fabrication steps changes the distribution of Ge fraction and stress, and increases atomic intermixing, which degrades device performance. It is of technological importance to study Si-Ge interdiffusion behaviours and build accurate Si-Ge interdiffusivity models.In this work, three aspects of Si-Ge interdiffusion behaviours were investigated both by experiments and by theoretical analysis.1) Based on the correlation between self-diffusivity, intrinsic diffusivity and interdiffusivity in binary alloy systems, a unified interdiffusivity model was built over the full Ge fraction range. It provides a zero-strain, no-dopant-effect, and low-dislocation-density reference for studies of more impacting factors. This model was then validated with literature data and our experimental data using different annealing techniques.Next, with the well-established reference, the impact of biaxial compressive strain on Si-Ge interdiffusion was further investigated under two specific strain scenarios: with full coherent strain and with partial strain. 2) Complete theoretical analysis was presented to address the compressive strain’s role in Si-Ge interdiffusion. The role of compressive strain was modeled in two aspects: a) strain energy contributes to the interdiffusion driving force; b) the strain derivative q' of interdiffusivity, reflecting the strain-induced changes of both prefactor and activation energy. For the temperature range (720 °C to 880 °C) and Ge fraction range (0.36 to 0.75), a temperature dependence of the strain derivative q', q'=-0.081T+110 eV/unit strain, was reported in Si-Ge interdiffusion. 3) For the case with partial strain, the apparent interdiffusivity model developed for the case with full coherent strain in 2) was modified to reflect strain change, and it was then validated with experimental data.In summary, a set of interdiffusivity models were established based on experimental data and theoretical analysis for three strain scenarios. These models can be employed to predict the thermal stability of SiGe heterostructures, and optimize the design of SiGe structures and of thermal budgets for next-generation SiGe based devices.
Master's Student Supervision (2010-2017)
Two-dimensional lamellar black phosphorus (BP) has emerged as a promisingsemiconductor for next generation integrated circuits (IC) and photonics, especiallyin flexible and ultra-thin electronic and photonic devices. With layer numbers of> 20 to 1, the electronic energy band gap of BP covers the range from 0.3 (bulk) to2 eV (single-layer), which can fill the gap between graphene and transition metaldi-chalcogenides (TMDCS). It is necessary to prepare uniform, large scale and crystallinefew-layer BP for industry applications. We investigated thinning rates of BP at different temperatures so that the userscan control the time of heating and have the ability to monitor the thickness ofBP during heating processes. Identification of crystallographic orientation (CO)of BP by Raman Spectroscopy is applied, which enables the Raman intensity ratiosbetween BP and substrates to be only thickness-dependent. This ratio can beused as a non-contact optical method to determine the actual thickness of BP duringpreparation, which is crucial to determine the end point of the thinning process.In this thesis work, we first reported the layer-by-layer sublimation of BP below600 K, which was observed by optical color changes; secondly, we investigated thethinning rates of BP at 500 K and 550 K to be 0.2 nm / min 500 K and 1.5nm / min at 550 K; thirdly, we investigated the effective determination of CO of BPand underlying Si by polarized Raman Spectroscopy with excitation wavelength of441.6 nm; fourthly, we investigated the thickness-dependent Raman peak intensity ratio Si/ A2g at a fixed CO, which can be used as an indicator of the thickness of BP;lastly, we presented the successful and repeatable preparation of large crystalline 2to 4 -layer BP. This work is the first study available to use the sublimation thinning as a controllablemethod to prepare large, uniform and crystalline BP down to 2-4 atomiclayers. This work is the first study available on developing an all-Raman methodin identifying the CO of BP, determining the in-situ and ex-situ thickness and confirmingthe crystallinity and uniformity of prepared BP.
No abstract available.
No abstract available.
Three-dimensional (3-D) integration has emerged as an effective solution to overcome the wiring limit imposed on device density and performance with continued scaling. Through silicon vias (TSVs), which provides interconnection between stacked chips, are essential for the 3-D integration. However, due to the large mismatch of the thermal expansion coefficients (CTEs) between via-filling material (Cu) and Si, thermal stresses induced during processing can result in undesirable mobility shifts in devices and serious reliability problems. In this work, the near-surface stress distributions around TSV structures were studied using both experimental and numerical approaches.Stress measurements and characterizations by micro-Raman spectroscopy at elevated temperatures are conducted to study the stress origin and evolution in TSV structures. Micro-Raman spectroscopy measures a combination of tensile and compressive near-surface stresses in the Si around TSVs. The results show that increasing the sample temperature towards the annealing temperature of the TSV sample will reduce the near-surface stresses around the TSVs. Temperature dependent measurements reveal that the stresses near TSVs have two components: 1) pre-existing stress before via filling, and 2) CTE mismatch-induced stress. To further understand the origins of the stress fields near TSVs, various TSV structures and via-filling materials are studied.The CTE mismatch-induced stress can be simulated by finite element analysis. The results obtained from the micro-Raman measurements are compared with the simulations. In particular, the differential values between the experimental data and simulation results are extracted in order to estimate the pre-existing stresses in the TSV structures. Once the pre-iiiexisting stress component is taken into account, a good agreement between the Raman measurement and the finite element calculation is obtained.The CTE-mismatch-induced stress resulted mobility change and keep-out zone (KOZ) at elevated temperatures are also estimated. Higher temperatures are shown to reduce the CTE-mismatch-induced stress component, and result in the shrinkage of KOZs in Si. The pre-existing stress is shown to be significant in a region equal or larger than the KOZs induced by CTE-mismatch-induced stress only and should be characterized and considered in the KOZ determination and circuit design.
Over the past two decades, researchers have devoted great efforts on Si photonics to overcome the communication bottleneck of integrated circuits. In order to realize short-reach optical interconnects, excellent performance has been achieved so far on waveguides, modulators and detectors, which use Si compatible materials (e.g. SiO₂, Si₃N₄ and SiGe) and processes. However, lasers on Si have been much more difficult to implement. Monolithically integrated vertical cavity surface emitting laser (VCSEL) on Si platforms are a suitable choice as output devices on Si, and is the long-term goal of this project. The research for this thesis work chose Ge/Si ART (aspect ratio trapping) substrates as the Si platform to overcome the material mismatch between AlGaAs/GaAs system and Si, and investigated the first and crucial step of successful VCSEL integration on Si platforms, which is the VCSEL distributed Bragg reflector (DBR) growth and characterization on Ge/Si ART substrates. Three types of samples were grown and characterized to reveal the quality of DBRs and ART substrates. The results show good quality and potential for high performance VCSEL. The ART-based DBRs have reflectance spectra comparable to those grown on conventional bulk GaAs substrates and have smooth morphology. High-resolution X-ray diffraction (HRXRD) rocking curves show that the residual stress and crystal quality of the Ge films depend on oxide trench patterns. Though GaAs-DBRs have sharper satellite peaks, ART-DBRs also show good structural quality, considering the effect of more complex substrate structure with SiO₂, Ge and strained-Ge. The main peaks’ full-width-at-half-maximum (FWHM) of ART-DBR are about twice as GaAs-DBR’s. Transmission electron microscopy (TEM) images reveal very good periodicity and uniformity that are unaffected by threading dislocations or residual strain. These results are very encouraging for the successful full VCSEL growth on these substrates and also confirm that virtual Ge substrates via the ART technique are effective Si platforms for optoelectronic integrated circuits.